Atomic scale simulation of defect production in irradiated 3C-SiC

被引:214
作者
Devanathan, R
Weber, WJ
Gao, F
机构
[1] Pacific NW Natl Lab, Richland, WA 99352 USA
[2] Indian Inst Technol, Dept Met Engn, Madras 600036, Chennai, India
关键词
D O I
10.1063/1.1389523
中图分类号
O59 [应用物理学];
学科分类号
摘要
Molecular dynamics simulations using a modified Tersoff potential have been used to study the primary damage state and statistics of defect production in displacement cascades in 3C-SiC. Recoils with energies from 0.25 to 50 keV have been simulated at 300 K. The results indicate that: (1) the displacement threshold energy surface is highly anisotropic; (2) the dominant surviving defects are C interstitials and vacancies; (3) the defect production efficiency decreases with increasing recoil energy; (4) defect clusters are much smaller and more sparse compared to those reported in metals; and (5) a small fraction of the surviving defects are antisite defects. (C) 2001 American Institute of Physics.
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页码:2303 / 2309
页数:7
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