Nanometer undulations on CaF2 cleaved surfaces observed by atomic force microscopy

被引：3

作者：

Coupeau, C

Small, MK

Junqua, N

Grilhe, J

机构：

[1] Lab. de Metall. Phys.-URA CNRS 131, Univ. de Poitiers-Fac. des Sciences, Bat. S.P.2.M.I, 86960 Futuroscope Cedex, Bd 3

来源：

关键词：

D O I：

10.1016/1359-6462(96)00058-9

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

[No abstract available]

引用

页码：1673 / 1678

页数：6

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