Edge effects in buckled thin films on elastomeric substrates

被引：29

作者：

Koh, C. T.

Liu, Z. J.

Khang, D.-Y.

Song, J.

Lu, C.

Huang, Y. ^{[1
]}

Rogers, J. A.

Koh, C. G.

机构：

[1] Northwestern Univ, Dept Mech Engn, Dept Civil & Environm Engn, Evanston, IL 60208 USA

[2] Inst High Performance Comp, Singapore 117528, Singapore

[3] Univ Illinois, Beckman Inst, Dept Mat Sci & Engn, Seitz Mat Res Lab, Urbana, IL 61801 USA

[4] Univ Illinois, Dept Mech Sci & Engn, Urbana, IL 61801 USA

[5] Natl Univ Singapore, Dept Civil Engn, Singapore, Singapore

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 13期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2791004

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal "wavy" relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus. (C) 2007 American Institute of Physics.

引用

页数：3

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