Electron-electron interaction, quantum interference and spin fluctuation effects in the resistivity of Fe-rich Fe-Zr metallic glasses

被引:15
作者
Babu, PD
Kaul, SN
Barquín, LF
Sal, JCG
Kettler, WH
Rosenberg, M
机构
[1] Univ Hyderabad, Sch Phys, Hyderabad 500046, Andhra Pradesh, India
[2] Bhabha Atom Res Ctr, Inter Univ Consortium, DAE Facil, Mumbai Ctr, Bombay 400085, Maharashtra, India
[3] Univ Cantabria, Fac Ciencias, Dept Ciencias Tierra & Fis Mat Condensada, E-39005 Santander, Spain
[4] Ruhr Univ Bochum, Inst Expt Phys 6, D-4630 Bochum, Germany
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 1999年 / 13卷 / 02期
关键词
D O I
10.1142/S0217979299000102
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electrical resistivity (rho) measurements have been performed in various temperature ranges on different batches of samples with nominal composition x = 0 and 1 in the amorphous alloy series Fe90+xZr10-x. An elaborate data analysis brings out clearly the actual functional dependences of rho on temperature (T) in different temperature ranges. The results of this analysis, when discussed in the light of existing theories, permit identification of the dominant mechanisms of electrical transport in different temperature regions as electron-diffuson (non-propagating longitudinal spin fluctuations) scattering for T less than or equal to 10 K, enhanced electron-electron interaction (EEI) effects in the range 10 K less than or equal to T less than or equal to 25 K and quantum interference (QI) effects, electron-phonon (e-ph) as well as electron-spin fluctuations scattering in different temperature ranges above 25 K. EEI and QI contributions to rho, in turn, yield fairly accurate values for the diffusion constant (that obey the Einstein relation) and the dephasing time. Out of the inelastic scattering processes such as e-ph scattering, spin-orbit scattering and spin-flip scattering that destroy phase coherence, e-ph scattering seems to be the most effective dephasing mechanism. Dephasing persists to temperatures well. above the Curie point and Debye temperature in the amorphous alloys in question.
引用
收藏
页码:141 / 159
页数:19
相关论文
共 69 条
[1]   EFFECTS OF SPIN FLUCTUATIONS ON THE RESISTIVITY OF METALLIC GLASSES [J].
ALTOUNIAN, Z ;
DANTU, SV ;
DIKEAKOS, M .
PHYSICAL REVIEW B, 1994, 49 (13) :8621-8626
[2]  
Altshuler B. L., 1985, Electron-electron interactions in disordered systems, P1
[3]   Scaling behaviour of magnetization for temperatures in the vicinity of, and far from, the ferromagnetic-paramagnetic phase transition in amorphous Fe-90-xCoxZr10 and Fe90+yZr10-y alloys [J].
Babu, PD ;
Kaul, SN .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1997, 9 (34) :7189-7222
[4]   SPIN FLUCTUATION EFFECTS IN, AND QUANTUM CORRECTIONS TO, THE CONDUCTIVITY OF FE90+XZR10-X (X=O, 1) METALLIC GLASSES [J].
BABU, PD ;
KAUL, SN ;
BARQUIN, LF ;
SAL, JCG .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1995, 140 :295-296
[5]   Magnetic and transport properties of Fe-Zr-B-(Cu) amorphous alloys [J].
Barandiaran, JM ;
Gorria, P ;
Orue, I ;
FernandezGubieda, ML ;
Plazaola, F ;
Sal, JCG ;
Barquin, LF ;
Fournes, L .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1997, 9 (26) :5671-5685
[6]   MODIFICATIONS OF WEAK LOCALIZATION CONTRIBUTIONS TO MAGNETORESISTANCE DUE TO MAGNETIC-IMPURITIES IN AMORPHOUS DYXY1-XNI ALLOYS [J].
BARBARA, B ;
AMARAL, VS ;
FILIPPI, J ;
JANSEN, AGM ;
SOUSA, JB ;
MOREIRA, JM .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (10) :5813-5818
[7]   ELECTRICAL-RESISTIVITY OF FE-ZR GLASSES FROM 4.2 TO 1100-K [J].
BARQUIN, LF ;
SAL, JCG ;
BABU, PD ;
KAUL, SN .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1994, 133 (1-3) :82-85
[8]   ELECTRICAL-RESISTIVITY BETWEEN 10-K AND 1000-K OF FERROMAGNETIC CO75SI25-XBX AND CO100-X(SI0.6B0.4)X AMORPHOUS RIBBONS [J].
BARQUIN, LF ;
FERNANDEZ, JR ;
SAL, JCG ;
BARANDIARAN, JM ;
VAZQUEZ, M .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (09) :4610-4616
[9]   FITTING TO MAGNETORESISTANCE UNDER WEAK LOCALIZATION IN 3 DIMENSIONS [J].
BAXTER, DV ;
RICHTER, R ;
TRUDEAU, ML ;
COCHRANE, RW ;
STROMOLSEN, JO .
JOURNAL DE PHYSIQUE, 1989, 50 (13) :1673-1688
[10]   WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].
BERGMANN, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58