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XAFS and CEMS study of dilute magneto-optical semiconductor, Fe doped TiO2 films

被引：20
作者：
Nomura, Kiyoshi
Eba, Hiromi
Sakurai, Kenji
Rykov, Alexandre
Hasegawa, Tetsuya
机构：
[1] Univ Tokyo, Sch Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Natl Inst Mat Sci, Tsukuba, Ibaraki 30500447, Japan
[3] Siberian Synchrotron Radiat Ctr, Novosibirsk 630090, Russia
[4] Univ Tokyo, Sch Sci, Tokyo 1138656, Japan
来源：
THIN SOLID FILMS | 2007年 / 515卷 / 24期
关键词：
Fe doped TiO2 films; dilute magneto-optical semiconductor (DMS); TiK X-ray; FeK X-ray; EXAFS; XANES; Mossbauer spectra;
D O I：
10.1016/j.tsf.2007.03.177
中图分类号：
T [工业技术];
学科分类号：
08 [工学];
摘要：
TiO2 films doped with 6% Fe were prepared by pulsed laser deposition (PLD) under different oxygen pressures, and characterized by X-ray absorption fine spectra (XAFS) and conversion electron Mossbauer spectra (CEMS). The edge energy and spectrum profiles of Fe- and Ti K X-ray absorption showed only Fe3+ and Ti4+ states for rutile TiO2 films prepared under 10(-1) Torr, the metallic Fe and Ti4+ for rutile TiO2 films prepared in 10(-6) Torr, and the metallic Fe and the average valance of less than "4+" for Ti in TinO2n-x films prepared by the PLD under 10(-8) Torr. The metallic Fe clusters are also found in the TEM images of TinO2n-x film. Magnetic property of Fe doped TiO2 films prepared by PLD at high vacuum (10(-6) and 10(-8) TorT) is considered to originate mainly from the magnetic metal iron clusters. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：8649 / 8652
页数：4
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