N-channel field effect transistors with fullerene thin films and their application to a logic gate circuit

被引:67
作者
Kanbara, T
Shibata, K
Fujiki, S
Kubozono, Y [1 ]
Kashino, S
Urisu, T
Sakai, M
Fujiwara, A
Kumashiro, R
Tanigaki, K
机构
[1] Okayama Univ, Dept Chem, Okayama 7008530, Japan
[2] Japan Sci & Technol Corp, CREST, Kawaguchi 3320012, Japan
[3] Okazaki Natl Res Inst, Inst Mol Sci, Dept Vacuum UV Photosci, Okazaki, Aichi 4448585, Japan
[4] Japan Adv Inst Sci & Technol, Ishikawa 9231292, Japan
[5] Osaka City Univ, Dept Mat Sci, Osaka 5588585, Japan
关键词
D O I
10.1016/j.cplett.2003.07.025
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
N-channel field effect transistors (FETs) were fabricated with thin films of C-60 and Dy@C-82. A typical enhancement-type FET property was observed in C-60 FET above 220 K. The mobility Of C-60 FET increased with increasing temperature. This fact suggests hopping transport as the conduction mechanism, with the activation energy of 0.29 eV. The Dy@C-82 FET was found to be a normally-on type FET, which has a property different from that for C-60 and C-70 FETs. A complementary metal oxide semiconductor (CMOS) logic gate circuit was first fabricated with C-60 and pentacene thin-film FETs. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:223 / 229
页数:7
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