Measurement of nanoscale external quantum efficiency of conjugated polymer:fullerene solar cells by photoconductive atomic force microscopy

被引：27

作者：

Dang, Xuan-Dung ^{[1
]}

Mikhailovsky, Alexander ^{[1
]}

Nguyen, Thuc-Quyen ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Chem & Biochem, Ctr Polymers & Organ Solids, Santa Barbara, CA 93106 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 11期

关键词：

CHARGE-TRANSPORT; MORPHOLOGY;

D O I：

10.1063/1.3483613

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Photoconductive atomic force microscopy is used to investigate nanoscale incident photon-to-current efficiency spectra of polymer bulk heterojunction solar cells based on poly[2-methoxy-5-(3,7-dimethyloctyloxy)]-1,4-phenylenevinylene (MDMO-PPV) and [6,6]-phenyl-C-71-butyric acid methyl ester (PC71BM). Nanoscale external quantum efficiency reveals the complex morphology of MDMO-PPV:PC71BM films cast from toluene solution. Not only electron transfer from the photoexcited donor to the fullerene but also hole transfer process from photoexcited fullerene to the donor phase due to highest occupied molecular orbital offset is observed. The difference in performance between toluene and chlorobenzene-cast devices is explained by the variation in relative contributions from two charge transfer mechanisms. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3483613]

引用

页数：3

共 14 条

[1] Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy [J].