Constraints, iteration schemes and convergence criteria for concentration calculations in X-ray fluorescence spectrometry with the use of fundamental parameter methods

被引:11
作者
Bos, M [1 ]
Vrielink, JAM [1 ]
机构
[1] Univ Twente, Dept Chem Anal, NL-7500 AE Enschede, Netherlands
关键词
X-ray fluorescence spectrometry; fundamental parameter calculations; influence coefficients;
D O I
10.1016/S0003-2670(98)00412-7
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A set of computer programs for X-ray fluorescence calculations, based on fundamental parameter methods, was developed in which some new combinations of mathematical refinement procedures were tested together with new target functions and iteration stop criteria. The results show that practical needs cannot be fulfilled with a single-universal method and a strategy is given to deal with the following situations: (1) not all elements present in the sample have been measured; (2) the mass thickness of the sample is not known and/or has to be determined together with the composition of the sample; and (3) the only unmeasured element is oxygen. If the optimal method is chosen, the results for the major constituents are accurate to better than 1%. For minor constituents, the accuracy is generally of the order of a few percent. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:291 / 302
页数:12
相关论文
共 20 条
[1]  
Bekkers MHJ, 1997, X-RAY SPECTROM, V26, P122, DOI 10.1002/(SICI)1097-4539(199705)26:3<122::AID-XRS220>3.3.CO
[2]  
2-M
[3]  
BENNETT H, 1992, XRF ANAL CERAMICS MI
[4]  
CLAISSE F, 1980, CAN SPECTROSC, V23, P87
[5]   CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS [J].
CRISS, JW ;
BIRKS, LS .
ANALYTICAL CHEMISTRY, 1968, 40 (07) :1080-&
[6]   VERSATILE X-RAY ANALYSIS PROGRAM COMBINING FUNDAMENTAL PARAMETERS AND EMPIRICAL COEFFICIENTS [J].
CRISS, JW ;
BIRKS, LS ;
GILFRICH, JV .
ANALYTICAL CHEMISTRY, 1978, 50 (01) :33-37
[7]   A genetic algorithm for model-free X-ray fluorescence analysis of thin films [J].
Dane, AD ;
Timmermans, PAM ;
vanSprang, HA ;
Buydens, LMC .
ANALYTICAL CHEMISTRY, 1996, 68 (14) :2419-2425
[8]  
de Boer D.K.G., 1990, Adv. X-Ray Anal., V33, P237, DOI [10.1007/978-1-4613-9996-4_26, DOI 10.1007/978-1-4613-9996-4_26]
[9]   CALCULATION OF X-RAY-FLUORESCENCE INTENSITIES FROM BULK AND MULTILAYER SAMPLES [J].
DEBOER, DKG .
X-RAY SPECTROMETRY, 1990, 19 (03) :145-154
[10]   FUNDAMENTAL PARAMETERS FOR X-RAY-FLUORESCENCE ANALYSIS [J].
DEBOER, DKG .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (11) :1171-1190