The use of voltage to accelerate the endurance degradation of PZT capacitors

被引:6
作者
Hadnagy, TD
Traynor, SD
Dalton, DI
机构
[1] Ramtron International Corporation, Colorado Springs, CO 80921
关键词
D O I
10.1080/10584589708013044
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A voltage vs. endurance model was created to predict the performance of PZT from 3 to 8 volts. Capacitors that are part of the street structure on finished wafer products were cycled from 10 to a total of le12 cycles. The switched charge was measured over 10 to 12 orders of magnitude in order to develop models to predict performance out to le15 cycles. The switched charge was found to degrade as a square function of the log of the number of cycles fatigued. The model was found to fit the data with an r(2) greater than .95. Utilizing the minimum allowable charge for a sense amplifier, this model could be used to predict part life over operating voltages.
引用
收藏
页码:219 / 227
页数:9
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