Process innovation and learning by doing in semiconductor manufacturing

被引:213
作者
Hatch, NW [1 ]
Mowery, DC
机构
[1] Univ Illinois, Dept Business Adm, Champaign, IL 61820 USA
[2] Univ Calif Berkeley, Haas Sch Business, Berkeley, CA 94720 USA
关键词
process technology development; process technology transfer; learning curves;
D O I
10.1287/mnsc.44.11.1461
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
This payer analyzes the relationship between process innovation and learning by doing in the semiconductor industry where improvements in manufacturing yield are a catalyst for dynamic cost reductions. In contrast to most previous studies of learning by doing, the learning curve is shown here to be the product of deliberate activities intended to improve yields and reduce costs, rather than the incidental byproduct of production volume. Since some of the knowledge acquired through learning by doing during new process development is specific to the production environment where the process is developed, some knowledge is effectively lost when a new process is transferred to manufacturing. We find that dedicated process development facilities, geographic proximity between development and manufacturing facilities, and the duplication of equipment between development and manufacturing facilities are all significant in improving performance in introducing new technologies. Once in manufacturing, new processes are shown to disrupt the ongoing learning activities of existing processes by drawing away scarce engineering resources to "debug" the new processes.
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页码:1461 / 1477
页数:17
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