SPOTX a ray tracing software for X-ray optics

被引:25
作者
Moreno, T
Idir, M
机构
[1] Soc CAMINOTEC, F-75013 Paris, France
[2] Univ Paris Sud, LURE, LSAI, F-91405 Orsay, France
来源
JOURNAL DE PHYSIQUE IV | 2001年 / 11卷 / PR2期
关键词
D O I
10.1051/jp4:20012103
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The most general way to determine the characteristics of an image is by ray tracing. Ray tracing is a simulation technique that allows to perform computer experiments with a given optical system at a very low cost. Ray tracing simulations are performed to obtain quantitative descriptions of several experimental parameters. It is a common tool in the visible region of the spectrum where several commercial packages are available, These packages are not well suited for the x-ray domain because x-ray optics are used in grazing incidence or strongly off-axis. To perform X-ray optics simulations, we have developed SPOTX a ray tracing software for the X-ray domain. In this paper, we will present several examples concerning optical design simulation in different domains such as synchrotron radiation beamline, x- ray plasma spectroscopy and x-ray laser focusing. We will also present the user friendly graphical interface allowing to quickly define the optical design under consideration.
引用
收藏
页码:527 / 531
页数:5
相关论文
共 2 条
[1]  
ATTWOOD D, 2000, SOFT XRAY EXTREME UL
[2]  
James R.W., 1982, OPTICAL PRINCIPLES D