Perpendicular magnetic recording media using hexagonal ferrite thin films deposited on Pt underlayers and interlayers

被引:32
作者
Nakagawa, S [1 ]
Matsushita, N [1 ]
Naoe, M [1 ]
机构
[1] Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
关键词
ferrite; underlayers; Facing Targets Sputtering; multilayers;
D O I
10.1016/S0304-8853(01)00371-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ba ferrite (BaM) thin films with excellent c-axis orientation were deposited on Pt(1 1 1) underlayers using Facing Targets Sputtering system. BaM thin films with extremely low thickness, as thin as 8 nm, exhibited apparent c-axis orientation. Such thin BaM layers exhibited small grain size. BaM/Pt multilayered structure was also effective to introduce exchange interaction among BaM crystallites. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:337 / 341
页数:5
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