Spectroscopy of a bulk GaN microcavity grown on Si(111)

被引:6
作者
Ollier, N [1 ]
Natali, F
Byrne, D
Disseix, P
Mihailovic, M
Vasson, A
Leymarie, J
Semond, F
Massies, J
机构
[1] Univ Clermont Ferrand, LASMEA, UMR 6602, CNRS, F-63177 Clermont Ferrand, France
[2] CNRS, CRHEA, F-06560 Valbonne, France
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 7A期
关键词
microcavity; nitride; strong coupling; exciton; reflectivity; photoluminescence; oscillator strength; polariton;
D O I
10.1143/JJAP.44.4902
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the experimental observation of the exciton-photon strong coupling regime in a GaN microcavity. The structure has been grown by molecular beam epitaxy on a Si(111) substrate. The upper mirror is a SiO2/Si3N4 dielectric mirror and the silicon substrate acts as the bottom one. Angle resolved reflectivity and photoluminescence experiments have allowed to demonstrate the exciton-photon strong coupling regime, characterized by a Rabi splitting of 31 meV at 5 K. From the modeling of experiments, the oscillator strengths of excitons A and B are evaluated and compared to the values previously published. Then, the design of the bulk microcavity is optimized in order to maintain the strong coupling regime at room temperature; our calculations predict a Rabi splitting of 33 meV at 300 K in this case. A second kind of structure based on GaN/AlGaN quantum wells is also proposed, leading to an expected splitting,of 19 meV at 300 K.
引用
收藏
页码:4902 / 4908
页数:7
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