Sputter deposition of gallium nitride films using a GaAs target

被引:60
作者
Elkashef, N [1 ]
Srinivasa, RS
Major, S
Sabharwal, SC
Muthe, KP
机构
[1] Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
[2] Indian Inst Technol, Dept Phys, Bombay 400076, Maharashtra, India
[3] Bhabha Atom Res Ctr, Tech Phys & Prototype Engn Div, Bombay 400085, Maharashtra, India
关键词
deposition process; nitrides; semiconductors; sputtering;
D O I
10.1016/S0040-6090(98)00550-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
GaAs was used as the target material for the deposition of GaN films by reactive sputtering. The films were grown at different compositions of the sputtering gas mixture (0-100% nitrogen in argon) at substrate temperatures of 450 and 550 degrees C. The films were studied using XRD and XPS techniques. Even a small quantity of nitrogen in the sputtering medium was found to prevent the formation of GaAs on the substrate. Films grown at 550 degrees C using 100% nitrogen as the sputtering-reactive gas were found to be single phase (0002) oriented hexagonal gallium nitride and revealed complete absence of arsenic. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:9 / 12
页数:4
相关论文
共 20 条
[1]  
BRIGGS D, 1979, PRACTICAL SURFACE AN
[2]   OPTICAL-PROPERTIES OF GAN EPITAXIAL-FILMS GROWN BY LOW-PRESSURE CHEMICAL-VAPOR EPITAXY USING A NEW NITROGEN-SOURCE - HYDRAZOIC ACID (HN3) [J].
BU, Y ;
LIN, MC ;
FU, LP ;
CHTCHEKINE, DG ;
GILLILAND, GD ;
CHEN, Y ;
RALPH, SE ;
STOCK, SR .
APPLIED PHYSICS LETTERS, 1995, 66 (18) :2433-2435
[3]   SELECTIVE GROWTH OF ZINCBLENDE, WURTZITE, OR A MIXED-PHASE OF GALLIUM NITRIDE BY MOLECULAR-BEAM EPITAXY [J].
CHENG, TS ;
JENKINS, LC ;
HOOPER, SE ;
FOXON, CT ;
ORTON, JW ;
LACKLISON, DE .
APPLIED PHYSICS LETTERS, 1995, 66 (12) :1509-1511
[4]   DEPOSITION, CHARACTERIZATION, AND DEVICE DEVELOPMENT IN DIAMOND, SILICON-CARBIDE, AND GALLIUM NITRIDE THIN-FILMS [J].
DAVIS, RF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04) :829-837
[5]   Room-temperature blue gallium nitride laser diode [J].
Fasol, G .
SCIENCE, 1996, 272 (5269) :1751-1752
[6]   ELECTRICAL AND OPTICAL PROPERTIES OF RF-SPUTTERED GAN AND INN [J].
HOVEL, HJ ;
CUOMO, JJ .
APPLIED PHYSICS LETTERS, 1972, 20 (02) :71-&
[7]   EFFECT OF SUBSTRATE PRETREATMENT ON GROWTH OF GAN ON (0001)SAPPHIRE BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION [J].
HWANG, CY ;
SCHURMAN, MJ ;
MAYO, WE ;
LI, Y ;
LU, Y ;
LIU, H ;
SALAGAJ, T ;
STALL, RA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03) :672-675
[8]   DEVELOPMENT OF CHEMICAL BEAM EPITAXY FOR THE DEPOSITION OF GALLIUM NITRIDE [J].
KINGSLEY, CR ;
WHITAKER, TJ ;
WEE, ATS ;
JACKMAN, RB ;
FOORD, JS .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1995, 29 (1-3) :78-82
[9]   PREPARATION AND PROPERTIES OF III-V NITRIDE THIN-FILMS [J].
KUBOTA, K ;
KOBAYASHI, Y ;
FUJIMOTO, K .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (07) :2984-2988
[10]   THE GROWTH OF HIGHLY RESISTIVE GALLIUM NITRIDE FILMS [J].
LAKSHMI, E ;
MATHUR, B ;
BHATTACHARYA, AB ;
BHARGAVA, VP .
THIN SOLID FILMS, 1980, 74 (01) :77-82