Coupled capillary wave fluctuations in thin aqueous films on an aqueous subphase

被引：19

作者：

Li, M ^{[1
]}

Tikhonov, AM

Chaiko, DJ

Schlossman, ML

机构：

[1] Univ Illinois, Dept Phys, 845 W Taylor St, Chicago, IL 60607 USA

[2] Argonne Natl Lab, Div Chem Technol, Argonne, IL 60439 USA

[3] Univ Illinois, Dept Chem, Chicago, IL 60607 USA

来源：

PHYSICAL REVIEW LETTERS | 2001年 / 86卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.86.5934

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray scattering and interfacial tension measurements are used to demonstrate the formation of nanometer-thick aqueous films on aqueous bulk subphases from polymer-salt biphase mixtures. X-ray scattering determines a coupling constant that characterizes the coupled capillary wave fluctuations of the liquid-vapor and liquid-liquid interfaces of this thin film. These data also determine an effective Hamakar constant that characterizes the long-range interaction between the interfaces and parameters that characterize the short-range part of the interfacial interaction.

引用

页码：5934 / 5937

页数：4

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