Inverse problem approach in particle digital holography:: out-of-field particle detection made possible

被引:62
作者
Soulez, Ferreol [1 ,2 ,3 ,4 ,5 ,6 ]
Denis, Loic [5 ,6 ,7 ]
Thiebaut, Eric [1 ,2 ,3 ,4 ]
Fournier, Corinne [5 ,6 ]
Goepfert, Charles [8 ]
机构
[1] Observ Lyon, CNRS, UMR 5574, Ctr Rech Astron Lyon, F-69561 St Genis Laval, France
[2] Univ Lyon 1, F-69622 Villeurbanne, France
[3] Univ Lyon, F-69000 Lyon, France
[4] Ecole Normale Super Lyon, F-69000 Lyon, France
[5] Univ St Etienne, CNRS, UMR 5516, Lab Hubert Curien Ex LTSI, F-42000 St Etienne, France
[6] Inst Super Tech Avancees St Etienne, F-4200 St Etienne, France
[7] CNRS, UMR 5141, GET Telecom Paris, Signal & Image Proc Dept, F-75013 Paris, France
[8] Univ Lyon 1, INSA Lyon, Ecole Cent Lyon, CNRS UMR 5509,Lab Mecan Fluides & Acoust, F-69134 Ecully, France
关键词
D O I
10.1364/JOSAA.24.003708
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a microparticle detection scheme in digital holography. In our inverse problem approach, we estimate the optimal particles set that best models the observed hologram image. Such a method can deal with data that have missing pixels. By considering the camera as a truncated version of a wider sensor, it becomes possible to detect particles even out of the camera field of view. We tested the performance of our algorithm against simulated and experimental data for diluted particle conditions. With real data, our algorithm can detect particles far from the detector edges in a working area as large as 16 times the camera field of view. A study based on simulated data shows that, compared with classical methods, our algorithm greatly improves the precision of the estimated particle positions and radii. This precision does not depend on the particle's size or location (i.e., whether inside or outside the detector field of view). (C) 2007 Optical Society of America.
引用
收藏
页码:3708 / 3716
页数:9
相关论文
共 15 条
[1]   Application of wavelet transform to hologram analysis:: three-dimensional location of particles [J].
Buraga-Lefebvre, C ;
Coëtmellec, S ;
Lebrun, D ;
Özkul, C .
OPTICS AND LASERS IN ENGINEERING, 2000, 33 (06) :409-421
[2]   Direct extraction of the mean particle size from a digital hologram [J].
Denis, L ;
Fournier, C ;
Fournel, T ;
Ducottet, C ;
Jeulin, D .
APPLIED OPTICS, 2006, 45 (05) :944-952
[3]   Digital in-line holography: influence of the reconstruction function on the axial profile of a reconstructed particle image [J].
Fournier, C ;
Ducottet, C ;
Fournel, T .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2004, 15 (04) :686-693
[4]  
Goodman J.W., 1996, Opt. Eng, V35, P1513
[5]  
HINSCH KD, 2004, MEAS SCI TECHNOL, V15, P601
[6]   Methods of digital holography: A comparison [J].
Kreis, TM ;
Adams, M ;
Juptner, WPO .
OPTICAL INSPECTION AND MICROMEASUREMENTS II, 1997, 3098 :224-233
[7]   Fresnelets: New multiresolution wavelet bases for digital holography [J].
Liebling, M ;
Blu, T ;
Unser, M .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2003, 12 (01) :29-43
[8]   Potential of digital holography in particle measurement [J].
Murata, S ;
Yasuda, N .
OPTICS AND LASER TECHNOLOGY, 2000, 32 (7-8) :567-574
[9]   Optimizing Fourier filtering for digital holographic particle image velocimetry [J].
Ooms, T ;
Koek, W ;
Braat, J ;
Westerweel, J .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (02) :304-312
[10]   Digital holography of particle fields: reconstruction by use of complex amplitude [J].
Pan, G ;
Meng, H .
APPLIED OPTICS, 2003, 42 (05) :827-833