Low voltage electrowetting-on-dielectric platform using multi-layer insulators

被引:122
作者
Lin, Yan-You [1 ]
Evans, Randall D. [1 ]
Welch, Erin [1 ]
Hsu, Bang-Ning [1 ]
Madison, Andrew C. [1 ]
Fair, Richard B. [1 ]
机构
[1] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA
来源
SENSORS AND ACTUATORS B-CHEMICAL | 2010年 / 150卷 / 01期
基金
美国国家科学基金会;
关键词
Electrowetting; Digital microfluidics; Tantalum pentoxide; Dimensional scaling; TA2O5; THIN-FILMS; LIQUID DROPLETS; ACTUATION;
D O I
10.1016/j.snb.2010.06.059
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A low voltage, two-level-metal, and multi-layer insulator electrowetting-on-dielectric (EWD) platform is presented. Dispensing 300 pl droplets from 140 nl closed on-chip reservoirs was accomplished with as little as 11.4 V solely through EWD forces, and the actuation threshold voltage was 7.2 V with a 1 Hz voltage switching rate between electrodes. EWD devices were fabricated with a multilayer insulator consisting of 135 nm sputtered tantalum pentoxide (Ta2O5) and 180 nm parylene C coated with 70 nm of CYTOP. Furthermore, the minimum actuation threshold voltage followed a previously published scaling model for the threshold voltage, VT, which is proportional to (t/εr)1/2, where t and εr are the insulator thickness and dielectric constant respectively. Device threshold voltages are compared for several insulator thicknesses (200 nm, 500 nm, and 1 μm), different dielectric materials (parylene C and tantalum pentoxide), and homogeneous versus heterogeneous compositions. Additionally, we used a two-level-metal fabrication process, which enables the fabrication of smaller and denser electrodes with high interconnect routing flexibility. We also have achieved low dispensing and actuation voltages for scaled devices with 30 pl droplets. © 2010 Published by Elsevier B.V.
引用
收藏
页码:465 / 470
页数:6
相关论文
共 24 条
[1]  
[Anonymous], 2005, INTRO MICROFLUIDICS
[2]  
Beithier J., 2008, MICRODROPS DIGITAL M
[3]  
BERGE B, 1993, CR ACAD SCI II, V317, P157
[4]   Irreversible electrowetting on thin fluoropolymer films [J].
Berry, Shaun ;
Kedzierski, Jakub ;
Abedian, Behrouz .
LANGMUIR, 2007, 23 (24) :12429-12435
[5]   Tantalum pentoxide (Ta2O5) thin films for advanced dielectric applications [J].
Chaneliere, C ;
Autran, JL ;
Devine, RAB ;
Balland, B .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 1998, 22 (06) :269-322
[6]   Driving characteristics of the electrowetting-on-dielectric device using atomic-layer-deposited aluminum oxide as the dielectric [J].
Chang, Jong-hyeon ;
Choi, Dae Young ;
Han, Seungoh ;
Pak, James Jungho .
MICROFLUIDICS AND NANOFLUIDICS, 2010, 8 (02) :269-273
[7]   Study on the amorphous Ta2O5 thin film capacitors deposited by de magnetron reactive sputtering for multichip module applications [J].
Cho, SD ;
Paik, KW .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 67 (03) :108-112
[8]   Creating, transporting, cutting, and merging liquid droplets by electrowetting-based actuation for digital microfluidic circuits [J].
Cho, SK ;
Moon, HJ ;
Kim, CJ .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2003, 12 (01) :70-80
[9]  
CHO SK, 2002, IEEE INT C MEMS, V11, P454
[10]   Influence of the porosity of RF sputtered Ta2O5 thin films on their optical properties for electrochromic applications [J].
Corbella, C ;
Vives, M ;
Pinyol, A ;
Porqueras, I ;
Person, C ;
Bertran, E .
SOLID STATE IONICS, 2003, 165 (1-4) :15-22