Nonuniform temperature distribution in electronic devices cooled by flow in parallel microchannels

被引:147
作者
Hetsroni, G [1 ]
Mosyak, A [1 ]
Segal, Z [1 ]
机构
[1] Technion Israel Inst Technol, Dept Mech Engn, IL-32000 Haifa, Israel
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2001年 / 24卷 / 01期
关键词
flow pattern; hydrodynamic instabilities; parallel microchannels; thermal irregularity; thermal pattern;
D O I
10.1109/6144.910797
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We fabricated a novel thermal microsystem (simulating a computer chip) consisting of a heater, microchannels;inlet and outlet plena and we studied the effect of the geometry on the now and heat transfer. The vapor-mater two-phase now patterns were observed in the parallel microchannels through a microscope and high-speed video camera. It was observed that hydraulic instabilities occur. Existence of a periodic annular flow was also observed, which consists of a symmetrically distributed liquid ring surrounding the vapor core. Along the microchannel axis, the periodic dry zone appears and develops. The thermal visualization and temperature measurements of the heated device were carried out using infrared thermography. As long as the flow was single phase liquid, the forced convection heat transfer resulted in a moderate irregularity on the heated chip. These temperature differences do not cause damage to a real electronic device. The steady-state heat transfer for different types of microchannels has been studied also at the range of heat flux where phase change of the working fluid from liquid to vapor took place. Under conditions of flow boiling in microchannels, a significant enhancement of beat transfer was established. In the ease of uniform heat flux the hydraulic instabilities lead to irregularity of temperature distribution on the heated chip. In the case of nonuniform heat flux the irregularity increased drastically.
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页码:16 / 23
页数:8
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