Multielement analysis of Chinese tea (Camellia sinensis) by total-reflection X-ray fluorescence

被引:85
作者
Xie, M
von Bohlen, A
Klockenkamper, R
Jian, X
Gunther, K
机构
[1] Inst Spektrochem & Angew Spektroskopie, D-44139 Dortmund, Germany
[2] Jianshi Inst Selenium Resources, Jianshi 445300, Hubei Province, Peoples R China
[3] Forschungszentrum Julich, Inst Appl Phys Chem, D-52425 Julich, Germany
来源
ZEITSCHRIFT FUR LEBENSMITTEL-UNTERSUCHUNG UND-FORSCHUNG A-FOOD RESEARCH AND TECHNOLOGY | 1998年 / 207卷 / 01期
关键词
tea leaves; Camellia sinensis; tea infusions; multielement analysis; total-reflection X-ray fluorescence;
D O I
10.1007/s002170050291
中图分类号
TS2 [食品工业];
学科分类号
0832 ;
摘要
Total-reflection X-ray fluorescence (TXRF) was used for the simultaneous determination of 15 elements in tea samples which were produced either by acid digestion or acidified infusion of tea leaves (Camellia sinensis). The accuracy and precision of the method were checked by its application to a certified reference material (GBW 08505:tea). A variety of 39 tea samples of different kinds andior qualities produced in different regions of China were analysed. The range and mean of the concentrations of elements in the tea leaves (0.1-30.000 mu g g(-1)) and their solubility in infusions (0.5-85%) were determined and the influence of the origin, type and quality of the tea samples was studied. In some tea leaves produced in a Se-rich region, the content of Se was found to be very high (up to 7.5 mu g g(-1)), in contrast to a concentration of only about 0.1 mu g g(-1) Se in most of the tea leaves examined.
引用
收藏
页码:31 / 38
页数:8
相关论文
共 27 条
[1]   DETERMINATION OF TOXIC ELEMENTS IN TEA LEAVES BY INSTRUMENTAL NEUTRON-ACTIVATION ANALYSIS [J].
AHMAD, S ;
CHAUDHARY, MS ;
MANNAN, A ;
QURESHI, IH .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1983, 78 (02) :375-383
[2]  
*ANNH AGR U, 1988, PRINC TECHN TEA PROD
[3]  
*DTSCH GES ERN, 1991, EMPF NAHR
[4]   MULTI-ELEMENT ANALYSIS OF JAPANESE TEA LEAVES BY NEUTRON-ACTIVATION ANALYSIS AND THE SINGLE COMPARATOR METHOD [J].
FUJINAGA, K ;
KUDO, K .
ANALYTICA CHIMICA ACTA, 1979, 110 (01) :75-79
[5]  
*HUN AGR U, 1984, EX JUDG TEA QUAL
[6]   DETERMINATION OF TRACE-ELEMENTS IN TEA LEAVES BY NEUTRON-ACTIVATION ANALYSIS [J].
KASRAI, M ;
SHOUSHTARIAN, MJ ;
BOZORGZADEH, MH .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1977, 41 (1-2) :73-79
[7]  
KATIYA SK, 1995, P 95 INT TEA QUAL HU, P7
[8]   TOTAL REFLECTION X-RAY-FLUORESCENCE - AN EFFICIENT METHOD FOR MICROANALYSIS, TRACE AND SURFACE-LAYER ANALYSIS [J].
KLOCKENKAMPER, R ;
VONBOHLEN, A .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1992, 7 (02) :273-279
[9]  
Klockenkamper R., 1997, Total Reflection X-ray Fluorescence Analysis
[10]   DETERMINATION OF MINERALS AND TRACE-ELEMENTS IN SELENIUM TEA FROM THE ENSCHI DISTRICT, PEOPLES-REPUBLIC-OF-CHINA, AND IN ITS INFUSIONS BY ICP-AES, GFAAS AND INAA [J].
MA, YH ;
RECKNAGEL, S ;
BRATTER, P ;
GAWLIK, D ;
DEBRATTER, VN ;
ROSICK, U ;
QIU, XG ;
JIAN, XH ;
GUNTHER, K ;
PFEILSTICKER, K ;
XIE, MY .
ZEITSCHRIFT FUR LEBENSMITTEL-UNTERSUCHUNG UND-FORSCHUNG, 1993, 197 (05) :444-448