Comparative study of thermally conductive fillers in underfill for the electronic components

被引:169
作者
Lee, WS [1 ]
Yu, J [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
关键词
composites; thermal properties; electronic device structures; diamond underfill;
D O I
10.1016/j.diamond.2005.05.008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
General underfill for the flip-chip package had a low thermal conductivity of about 0.2 W/mK. Thermal properties of underfill were measured with various fillers, such as silica, alumina, boron nitride, (BN) and diamond. Coefficient of thermal expansion (CTE) was changed by filler content and CTE of silica 60 wt.% was 28 ppm; BN 30 wt.%, 25 ppm; alumina 60 wt.%, 39 ppm; and diamond 60 wt.%, 24 ppm. The viscosity of underfill was measured with the cone and plate rheometer. Thermal diffusivity was measured with the laser flash method. Diamond filler loaded underfill showed the highest thermal conductivity 60 wt.%; 1.17 W/mK at 55 degrees C. Thermal conductivity of underfill was changed with a transition of heat capacity by the temperature increment in same filler content. In case of different filler content, thermal conductivity was changed with a transition of the thermal diffusivity. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1647 / 1653
页数:7
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