CEMS and XPS studies on iron states in sputtered Fe-Al-O granular TMR films

被引：3

作者：

Abuliemu, A ^{[1
]}

Wakabayashi, H ^{[1
]}

Matsuzawa, S ^{[1
]}

Nakanishi, Y ^{[1
]}

Toriyama, T ^{[1
]}

Sakamoto, I ^{[1
]}

Shen, HL ^{[1
]}

Hayashi, N ^{[1
]}

机构：

[1] Musashi Inst Technol, Setagaya Ku, Tokyo 1588557, Japan

来源：

SECOND SEEHEIM CONFERENCE ON MAGNETISM, PROCEEDINGS | 2004年

关键词：

D O I：

10.1002/pssc.200405445

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In order to glean the origin of the difference between TMR effects in sputtered Fe-Al-O granular films and Fe-implanted Al2O3 granular film, the iron ionic states and the size distributions for alpha-Fe particles in sputtered Fe-Al-O granular TMR films were investigated using Conversion Electron Mossbauer Spectroscopy (CEMS) with and without applied magnetic field. From CEMS without magnetic field, the ferric iron phase (Fe3+) in contrast to the superparamagnetic a-Fe particles and ferrous iron(Fe2+) phases observed for the Fe- implanted samples, was found to appear in the sputtered films where TMR effect was noticeable. From CEMS applied with 0.4 T magnetic field, the size distribution of a-Fe superparamagnetic particles was found to be broaden around 4 nm and not separated into two groups as observed in the Fe-implanted Al2O3 granular film. In addition XPS was used for depth profiling.

引用

页码：3315 / 3318

页数：4

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