Power supply distribution and other wiring issues for deep-submicron IC's

被引:4
作者
Lynch, WT [1 ]
Arledge, LA [1 ]
机构
[1] Semicond Res Corp, Res Triangle Pk, NC 27709 USA
来源
ADVANCED INTERCONNECTS AND CONTACT MATERIALS AND PROCESSES FOR FUTURE INTEGRATED CIRCUITS | 1998年 / 514卷
关键词
D O I
10.1557/PROC-514-11
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An Interconnect Architecture Optimization (IAO) methodology is proposed. The algorithm makes use of fundamental RLCLL2, relations for wiring delays, as well as predictive 3D interconnect density function histograms with y and x axes of wire length and inverse gate delay. The fundamental RLCLL2 relations determine "maximum" wire lengths as a function of wiring size within the wiring hierarchy; the 3D histogram establishes the pre-physical design allocations of wiring nets within the hierarchy. The decision process begins with the set-asides of wiring for power, clock, and vias, and ends with an optimized number of wiring levels and sizes. Some of the major conclusions of the preliminary analyses are: there are no significant problems with wiring at the lowest level as long as the local wire lengths are appropriately scaled; the MOSFET device may not be able to provide enough current to satisfy the capacitive fanout loads within the future allocations of clock period; and the global wires, despite significant improvements in performance, will continue to provide a design and technology challenge for larger chips and higher frequencies.
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页码:11 / 27
页数:17
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