Simple efficient coordinate markers for investigating synthetic nanofibers

被引：22

作者：

Kim, GT ^{[1
]}

Waizmann, U ^{[1
]}

Roth, S ^{[1
]}

机构：

[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 21期

关键词：

D O I：

10.1063/1.1419054

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A system of simple coordinate markers has been developed to facilitate the identification of individual synthetic nanofibers adsorbed on a substrate. The markers are deposited by electron beam lithography and allow to locate any spot on an atomic force microscope image and to deposit new structures close to this spot, such as lithographic contacts to nanotubes. As a demonstration, current-voltage characteristics of a junction between a metallic carbon nanotube and an n-type V2O5 nanofiber were recorded. (C) 2001 American Institute of Physics.

引用

页码：3497 / 3499

页数：3

共 7 条

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