Calibration results for the AXAF flight contamination monitor

被引：11

作者：

Elsner, RF ^{[1
]}

O'Dell, SL ^{[1
]}

Ramsey, BD ^{[1
]}

Tennant, AF ^{[1
]}

Weisskopf, MC ^{[1
]}

Kolodziejczak, JJ ^{[1
]}

Swartz, DA ^{[1
]}

Engelhaupt, DE ^{[1
]}

Garmire, GP ^{[1
]}

Nousek, JA ^{[1
]}

Bautz, MW ^{[1
]}

Gaetz, TJ ^{[1
]}

Zhao, P ^{[1
]}

机构：

[1] NASA, George C Marshall Space Flight Ctr, Huntsville, AL 35812 USA

来源：

X-RAY OPTICS, INSTRUMENTS, AND MISSIONS | 1998年 / 3444卷

关键词：

X-ray optics; calibration;

D O I：

10.1117/12.331235

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

引用

页码：177 / 188

页数：12