Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range

被引:185
作者
van Oudheusden, T.
de Jong, E. F.
van der Geer, S. B.
Root, W. P. E. M. Op't
Luiten, O. J.
Siwick, B. J.
机构
[1] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[2] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada
[3] McGill Univ, Dept Chem, Montreal, PQ H3A 2T8, Canada
关键词
D O I
10.1063/1.2801027
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 mu m and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept. (C) 2007 American Institute of Physics.
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页数:8
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