Magnetization reversal processes in perpendicular anisotropy thin films observed with magnetic force microscopy

被引:13
作者
Schmidt, J [1 ]
Skidmore, G
Foss, S
Dahlberg, ED
Merton, C
机构
[1] Univ Minnesota, Sch Phys & Astron, Magnet Microscopy Ctr, Minneapolis, MN 55455 USA
[2] Imat Corp, St Paul, MN 55128 USA
关键词
magnetic reversal; thin films; domain wall motion;
D O I
10.1016/S0304-8853(98)00277-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have carried out studies of the magnetic reversal process of a rare earth-transition metal thin film with perpendicular magnetic anisotropy using a magnetic force microscope (MFM) capable of applying in situ magnetic fields. The magnetization of the microscopic area shown in MFM images was determined for a number of field values comprising a complete hysteresis loop. This microscopic hysteresis loop was found to be nearly identical to a bulk hysteresis loop. Changes in the magnetization of the film as the hysteresis loop was traversed can be linked to individual microscopic domain changes evident in the MFM images. These studies show that the magnetization of this film was characterized by a two-stage process - fast and slow rates of change of magnetization with applied field. A second experiment in which the film was incompletely saturated and brought back to zero field showed that domain nucleation was not responsible for the rate of the fast process, but rather all magnetization changes were primarily limited by the low domain wall mobility. These observations are linked to previous work on naagnetization processes in similar magnetic systems. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:81 / 88
页数:8
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