Atomic scale kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface

被引：103

作者：

Enevoldsen, G. H. ^{[1
,2
]}

Glatzel, T. ^{[3
]}

Christensen, M. C. ^{[1
,2
]}

Lauritsen, J. V. ^{[1
,2
]}

Besenbacher, F. ^{[1
,2
]}

机构：

[1] Aarhus Univ, Interdisciplinary Nanosci Ctr iNANO, DK-8000 Aarhus C, Denmark

[2] Aarhus Univ, Dept Phys & Astron, DK-8000 Aarhus C, Denmark

[3] Univ Basel, Dept Phys, CH-4003 Basel, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 100卷 / 23期

关键词：

D O I：

10.1103/PhysRevLett.100.236104

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.

引用

页数：4

共 28 条

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