Development of parametric material, energy, and emission inventories for wafer fabrication in the semiconductor industry

被引:63
作者
Murphy, CF
Kenig, GA
Allen, DT
Laurent, JP
Dyer, DE
机构
[1] Univ Texas, Ctr Energy & Environm Resources, Austin, TX 78758 USA
[2] Int SEMATECH, Austin, TX 78741 USA
关键词
D O I
10.1021/es034434g
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Currently available data suggest that most of the energy and material consumption related to the production of an integrated circuit is due to the wafer fabrication process. The complexity of wafer manufacturing, requiring hundreds of steps that vary from product to product and from facility to facility and which change every few years, has discouraged the development of material, energy, and emission inventory modules for the purpose of insertion into life cycle assessments. To address this difficulty, a flexible, process-based system for estimating material requirements, energy requirements, and emissions in wafer fabrication has been developed. The method accounts for mass and energy use at the unit operation level. Parametric unit operation modules have been developed that can be used to predict changes in inventory as the result of changes in product design, equipment selection, or process flow. A case study of the application of the modules is given for energy consumption, but a similar methodology can be used for materials, individually or aggregated.
引用
收藏
页码:5373 / 5382
页数:10
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