Conductance of a perfect thin film with diffuse surface scattering

被引：12

作者：

Bergmann, G ^{[1
]}

机构：

[1] Univ So Calif, Dept Phys, Los Angeles, CA 90089 USA

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 10期

关键词：

D O I：

10.1103/PhysRevLett.94.106801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The conductance of thin films with diffusive surface scattering was solved semiclassically by Fuchs and Sondheimer. However, when the intrinsic electron mean free path is very large or infinite their conductance diverges. In this Letter a simple diffraction picture is presented. It yields a conductance which corresponds to a limiting mean free path of a(2)/lambda(F), where a is the film thickness.

引用

页数：3