Subsurface defect detection in ceramic materials using optical gating techniques

被引：12

作者：

Battle, PR ^{[1
]}

Bashkansky, M ^{[1
]}

Mahon, R ^{[1
]}

Reintjes, J ^{[1
]}

机构：

[1] USN,RES LAB,LASER PHYS BRANCH,WASHINGTON,DC 20375

来源：

OPTICAL ENGINEERING | 1996年 / 35卷 / 04期

关键词：

ceramic materials; nondestructive evaluation; optical gating;

D O I：

10.1117/1.601031

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate the use of optical gating techniques for determining the size and location of defects in advanced ceramic materials. The subsurface region in a bearing-grade silicon nitride ceramic material is probed using an optical gate based on broadband Raman scattering. Experimental results indicate that the size and distribution of small subsurface defects can be determined. (C) 1996 Society of Photo-Optical instrumentation Engineers.

引用

页码：1119 / 1123

页数：5

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