Si-rich SiC(111)/(0001)3x3 and √3x√3 surfaces:: A Mott-Hubbard picture

被引:76
作者
Furthmuller, J
Bechstedt, F
Hüsken, H
Schröter, B
Richter, W
机构
[1] Univ Jena, Inst Festkorpertheorie & Theoret Opt, D-07743 Jena, Germany
[2] Univ Jena, Inst Festkorperphys, D-07743 Jena, Germany
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 20期
关键词
D O I
10.1103/PhysRevB.58.13712
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic structures of Si-rich reconstructions of SiC surfaces oriented parallel to the c axis are studied by means of first-principles calculations and angle-resolved photoemission spectroscopy (ARUPS). Independent of the reconstruction model, but in particular for the most favorable Si adtetramer-adlayer and T-4-site Si adatom models, the density-functional theory gives rise to half-filled pronounced dangling bond bands within the fundamental gap clearly indicating metallic surfaces. In contrast to theory, ARUPS observes only Wry occupied surface-state bands but no density of states at the Fermi energy. The explanation of the discrepancies within a Mott-Hubbard picture allows a reliable description of the details of the surface band structure.[S0163-1829(98)03444-4].
引用
收藏
页码:13712 / 13716
页数:5
相关论文
共 29 条
[1]  
Bechstedt F, 1997, PHYS STATUS SOLIDI B, V202, P35, DOI 10.1002/1521-3951(199707)202:1<35::AID-PSSB35>3.0.CO
[2]  
2-8
[3]   CORRELATION-EFFECTS ON THE ELECTRONIC-STRUCTURE OF 1X1 AND 2X1 RECONSTRUCTED SI(111) SURFACES [J].
DELSOLE, R ;
CHADI, DJ .
PHYSICAL REVIEW B, 1981, 24 (12) :7431-7434
[4]   Hexagonal and cubic SiC thin films on SiC deposited by solid source MBE [J].
Fissel, A ;
Pfennighaus, K ;
Kaiser, U ;
Schroter, B ;
Richter, W .
DIAMOND AND RELATED MATERIALS, 1997, 6 (10) :1316-1320
[5]  
FRANKE M, 1997, VERH DTSCH PHYS GES, V32, P866
[6]   Model of the epitaxial growth of SiC-polytypes under surface-stabilized conditions [J].
Furthmuller, J ;
Kackell, P ;
Bechstedt, F ;
Fissel, A ;
Pfennighaus, K ;
Schroter, B ;
Richter, W .
JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (07) :848-852
[7]   COULOMB INTERACTIONS IN SEMICONDUCTORS AND INSULATORS [J].
HARRISON, WA .
PHYSICAL REVIEW B, 1985, 31 (04) :2121-2132
[10]   High-resolution core-level study of 6H-SiC(0001) [J].
Johansson, LI ;
Owman, F ;
Martensson, P .
PHYSICAL REVIEW B, 1996, 53 (20) :13793-13802