Meyer-Neldel-behavior of deep level parameters in heterojunctions to Cu(In,Ga)(S,Se)(2)

被引:59
作者
Herberholz, R
Walter, T
Muller, C
Friedlmeier, T
Schock, HW
Saad, M
LuxSteiner, MC
Alberts, V
机构
[1] HAHN MEITNER INST BERLIN GMBH,D-14109 BERLIN,GERMANY
[2] RAND AFRIKAANS UNIV,JOHANNESBURG,SOUTH AFRICA
关键词
D O I
10.1063/1.117352
中图分类号
O59 [应用物理学];
学科分类号
摘要
Admittance spectroscopy was measured on Cu(In, Ga)(S,Se)(2) thin film and single crystal heterojunctions. The emission rates of defects for various near-stoichiometric compositions follow a Meyer-Neldel rule, showing increasing attempt-to-escape frequencies with increasing defect depth. Defects in highly (In,Ga)-rich material showed lower attempt-to-escape frequencies and follow a separate Meyer-Neldel relation. Repetitive air annealing of a CulnSe(2) heterojunction revealed a shift of the depth and capture cross section of an observed defect. (C) 1996 American Institute of Physics.
引用
收藏
页码:2888 / 2890
页数:3
相关论文
共 10 条
  • [1] Alberts V, 1996, J MATER SCI-MATER EL, V7, P91, DOI 10.1007/BF00225630
  • [2] THIN-FILM SOLAR-CELLS
    BLOSS, WH
    PFISTERER, F
    SCHUBERT, M
    WALTER, T
    [J]. PROGRESS IN PHOTOVOLTAICS, 1995, 3 (01): : 3 - 24
  • [3] GROWTH OF BULK CU0.85IN1.05SE2 AND CHARACTERIZATION ON A MICRO SCALE
    HORNUNG, M
    BENZ, KW
    MARGULIS, L
    SCHMID, D
    SCHOCK, HW
    [J]. JOURNAL OF CRYSTAL GROWTH, 1995, 154 (3-4) : 315 - 321
  • [4] SAAD M, 1994, C REC 24 IEEE PHOT S, P214
  • [5] THE MEYER-NELDEL RULE IN EMISSION RATES FROM DEFECTS IN COPPER INDIUM DISELENIDE
    SHAPIRO, FR
    TUTTLE, JR
    [J]. SOLID STATE COMMUNICATIONS, 1993, 87 (03) : 199 - 202
  • [6] v Meyer W., 1937, Z TECHN PHYS, V18
  • [7] WALRTER T, 1996, SOL ENERG MAT SOL C, V41, P355
  • [8] Determination of defect distributions from admittance measurements and application to Cu(In,Ga)Se-2 based heterojunctions
    Walter, T
    Herberholz, R
    Muller, C
    Schock, HW
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 80 (08) : 4411 - 4420
  • [9] WALTER TH, UNPUB
  • [10] ORIGIN AND CONSEQUENCES OF THE COMPENSATION (MEYER-NELDEL) LAW
    YELON, A
    MOVAGHAR, B
    BRANZ, HM
    [J]. PHYSICAL REVIEW B, 1992, 46 (19): : 12244 - 12250