PMU Uncertainty Quantification in Voltage Stability Analysis

被引：23

作者：

Chen, Chen ^{[1
]}

Wang, Jianhui ^{[1
]}

Li, Zhengshuo ^{[2
]}

Sun, Hongbin ^{[2
]}

Wang, Zhaoyu ^{[3
]}

机构：

[1] Argonne Natl Lab, Decis & Informat Sci Div, Argonne, IL 60049 USA

[2] Tsinghua Univ, Dept Elect Engn, State Key Lab Power Syst, Beijing 10084, Peoples R China

[3] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

来源：

IEEE TRANSACTIONS ON POWER SYSTEMS | 2015年 / 30卷 / 04期

关键词：

Phasor measurement unit; recursive least square; uncertainty; voltage stability;

D O I：

10.1109/TPWRS.2014.2357217

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];

摘要：

This letter presents an uncertainty quantification method for phasor measurement units (PMUs) in voltage stability assessment. The effect of local phasor measurement uncertainty on the Thevenin equivalent impedance used for voltage stability analysis is quantified analytically. The results can be used to specify the requirements for PMU uncertainty in voltage stability assessment.

引用

页码：2196 / 2197

页数：2

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