Shifted-contour auxiliary field Monte Carlo for ab initio electronic structure:: Straddling the sign problem

被引:47
作者
Baer, R [1 ]
Head-Gordon, M
Neuhauser, D
机构
[1] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Chem Sci, Berkeley, CA 94720 USA
[3] Univ Calif Los Angeles, Dept Chem & Biochem, Los Angeles, CA 90095 USA
关键词
D O I
10.1063/1.477300
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The auxiliary held Monte Carlo (AFMC) technique has advantages over other ab initio quantum Monte Carlo methods for fermions, as it does not seem to require approximations for alleviating the sign problem and is directly applicable to excited states. Yet, the method is severely limited by a numerical instability, a numerical sign problem, prohibiting application to realistic electronic structure systems. Recently, the shifted contour auxiliary field method (SC-AFMC) was proposed for overcoming this instability. Here we develop a theory for the AFMC stabilization, explaining the success of SC-AFMC. We show that the auxiliary fields can be shifted into the complex plane in a manner that considerably stabilizes the Monte Carlo integration using the exact one-electron density. Practical stabilization can be achieved when an approximate Hartree-Fock density is used, proposing that an overwhelming part of the sign problem is removed by taking proper account of the Fermion mean-field contribution. The theory is demonstrated by application to H-2. (C) 1998 American Institute of Physics. [S0021 -9606(98)00539-X].
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页码:6219 / 6226
页数:8
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