Thin film poly-Si solar cell on glass substrate fabricated at low temperature

被引:49
作者
Yamamoto, K [1 ]
Yoshimi, M [1 ]
Suzuki, T [1 ]
Tawada, Y [1 ]
Okamoto, Y [1 ]
Nakajima, A [1 ]
机构
[1] Kaneka Corp, Cent Res Labs, Hyogo Ku, Kobe, Hyogo 652, Japan
来源
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998 | 1998年 / 507卷
关键词
D O I
10.1557/PROC-507-131
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The performances of thin film poly-Si solar cells with a thickness of less than 5 mu m on a glass substrate have been investigated. The cell of glass / back reflector / n-i-p type Si / ITO is well characterized by the structure of naturally surface texture and enhanced absorption with a back reflector (STAR), where the active i-type poly-Si layer was fabricated by plasma chemical vapor deposition (CVD) at low temperature. The cell with a thickness of 2.0 mu m demonstrated an intrinsic efficiency of 10.7% (aperture 10.1%), the open circuit voltage of 0.539 V and the short current density of 25.8 mA/cm(2) as independently confirmed by Japan Quality Assurance. The optical confinement effect explains the excellent spectral response at long wavelength for our cells through the PC1D analysis. The higher sensitivity at long-wavelength of our cell appeared in quantum efficiency curves is well correlated to the result of reflectance measurement. The efficiency of 9.3% cell with a thickness of 1.5 mu m was proved to be entirely stable with respect to the light-soaking. Based on the result of various evaluation of diffusion length, it is postulated that the low temperature poly-Si prepared by plasma CVD gives a device quality of poly-Si film.
引用
收藏
页码:131 / 138
页数:8
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