Radiation pattern from a double slit illuminated by parametric fluorescence light

被引:1
作者
Brida, G [1 ]
Novero, C [1 ]
机构
[1] Ist Elettrotecnico Nazl Galileo Ferraris, I-10135 Turin, Italy
关键词
D O I
10.1088/0026-1394/40/1/347
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper reports on the interference and diffraction effects produced by a double slit illuminated with parametric fluorescence light. We have evaluated, in a one-dimensional frame, the single and joint photon detection probability per unit of area, with respect to the position of a couple of detectors, far from the slits, in the so-called Fraunhofer region.
引用
收藏
页码:S204 / S207
页数:4
相关论文
共 11 条
[1]   Double-slit interference of biphotons generated in spontaneous parametric downconversion from a thick crystal [J].
Abouraddy, AF ;
Saleh, BEA ;
Sergienko, AV ;
Teich, MC .
JOURNAL OF OPTICS B-QUANTUM AND SEMICLASSICAL OPTICS, 2001, 3 (01) :S50-S54
[2]  
[Anonymous], 2018, PHOTONS NONLINEAR OP
[3]  
Born M., 1999, PRINCIPLES OPTICS
[4]   Towards an uncertainty budget in quantum-efficiency measurements with parametric fluorescence [J].
Brida, G ;
Castelletto, S ;
Degiovanni, IP ;
Genovese, M ;
Novero, C ;
Rastello, ML .
METROLOGIA, 2000, 37 (05) :629-632
[5]   Quantum-efficiency measurement of photodetectors by means of correlated photons [J].
Brida, G ;
Castelletto, S ;
Novero, C ;
Rastello, ML .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1999, 16 (10) :1623-1627
[6]  
FEYNMAN RP, 1965, FEYNMAN LECT PHYS, V3, pCH1
[7]   Bohmian trajectories for photons [J].
Ghose, P ;
Majumdar, AS ;
Guha, S ;
Sau, J .
PHYSICS LETTERS A, 2001, 290 (5-6) :205-213
[8]  
Goodman W., 2005, INTRO FOURIER OPTICS, V3rd
[9]   Two-photon double-slit interference experiment [J].
Hong, CK ;
Noh, TG .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1998, 15 (03) :1192-1197
[10]   CONTROLLING THE DEGREE OF VISIBILITY OF YOUNGS FRINGES WITH PHOTON COINCIDENCE MEASUREMENTS [J].
RIBEIRO, PHS ;
PADUA, S ;
DASILVA, JCM ;
BARBOSA, GA .
PHYSICAL REVIEW A, 1994, 49 (05) :4176-4179