Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes
被引:38
作者:
Das, D
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Comp Engn Res Ctr, Austin, TX 78712 USAUniv Texas, Dept Elect & Comp Engn, Comp Engn Res Ctr, Austin, TX 78712 USA
Das, D
[1
]
Touba, NA
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Comp Engn Res Ctr, Austin, TX 78712 USAUniv Texas, Dept Elect & Comp Engn, Comp Engn Res Ctr, Austin, TX 78712 USA
Touba, NA
[1
]
机构:
[1] Univ Texas, Dept Elect & Comp Engn, Comp Engn Res Ctr, Austin, TX 78712 USA
来源:
16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS
|
1998年
关键词:
D O I:
10.1109/VTEST.1998.670885
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection based oil Bose-Lin codes. Bose-Lin codes are an efficient solution for providing concurrent error detection as they are separable codes and have a fixed number of check bits, independent of the number of information bits. Furthermore, Bose-Lbl code checkers have a simple structure as they are based on modulo operations. procedures are described for synthesizing circuits in a way that their structure ensures that all single-point faults can only cause errors that are detected by a Bose-Lin code. This paper also presents art efficient scheme for concurrent error detection in sequential circuits. Both the state bits and the output bits are encoded with a Bose-Lin code and their checking is combined such that one checker suffices. Results indicate low area overhead The cost of concurrent error detection is reduced significantly compared to other methods.