Intrinsic luminance loss in phosphorescent small-molecule organic light emitting devices due to bimolecular annihilation reactions

被引：310

作者：

Giebink, N. C. ^{[1
,2
,3
]}

D'Andrade, B. W. ^{[4
]}

Weaver, M. S. ^{[4
]}

Mackenzie, P. B. ^{[4
]}

Brown, J. J. ^{[4
]}

Thompson, M. E. ^{[5
]}

Forrest, S. R. ^{[2
,3
]}

机构：

[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA

[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA

[3] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

[4] Universal Display Corp, Ewing, NJ 08618 USA

[5] Univ So Calif, Dept Chem, Los Angeles, CA 90089 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 04期

关键词：

D O I：

10.1063/1.2884530

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Operational degradation of blue electrophosphorescent organic light emitting devices (OLEDs) is studied by examining the luminance loss, voltage rise, and emissive layer photoluminescence quenching that occur in electrically aged devices. Using a model where defect sites act as deep charge traps, nonradiative recombination centers, and luminescence quenchers, we show that the luminance loss and voltage rise dependence on time and current density are consistent with defect formation due primarily to exciton-polaron annihilation reactions. Defect densities similar to 10(18) cm(-3) result in >50% luminance loss. Implications for the design of electrophosphorescent OLEDs with improved lifetime are discussed. (C) 2008 American Institute of Physics.

引用

页数：9

共 30 条

[1] Nearly 100% internal phosphorescence efficiency in an organic light-emitting device [J].