Calculation of the frequency shift in dynamic force microscopy

被引:110
作者
Hölscher, H
Schwarz, UD
Wiesendanger, R
机构
[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
关键词
atomic force microscopy; frequency modulation force microscopy; dynamic force microscopy; tip-sample interaction; frequency shift; oscillating cantilever;
D O I
10.1016/S0169-4332(98)00552-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A theoretical study of the quality and the range of validity of different numerical and analytical methods to calculate the frequency shift in dynamic force microscopy is presented. By comparison with exact results obtained by the numerical solution of the equation of motion, it is demonstrated that the commonly used interpretation of the frequency shift as a measure for the force gradient of the tip-sample interaction force is only valid for very small oscillation amplitudes and leads to misinterpretations in most practical cases. Perturbation theory, however, allows the derivation of useful analytic approximations. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:344 / 351
页数:8
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