Novel conductive transparent tip for low-temperature tunneling-electron luminescence microscopy using tip collection

被引:30
作者
Murashita, T
机构
[1] NTT System Electronics Laboratories, Atsugi, Kanagawa 243-01
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 01期
关键词
D O I
10.1116/1.589250
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Tip collection of luminescence is advantageous in low-temperature tunneling-electron luminescence microscopy because it can improve spatial resolution, luminescence collection yield, and thermal isolation. We have developed a novel conductive transparent (CT) tip that injects tunneling electrons into a sample and simultaneously collects tunneling-electron luminescence (TL). Essential features of the CT tip are a multimode fiber with a flame-shape tapered to a point, a gold-on-In2O3 double layer that serves as an optically transparent electrode to the apex, and a thick coaxial metal prating on the optical-fiber shaft that reinforces the CT tip allowing it to be firmly screwed onto a holder. The CT tip can easily be changed in a vacuum chamber like an air-metal tip. Using a TL microscope with the CT tip, TL spectra and TL images were successfully obtained on the cross section of GaAs(50 nm)/AlAs(50 nm) multiple quantum wells at 10 K. (C) 1997 American Vacuum Society.
引用
收藏
页码:32 / 37
页数:6
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