Electron backscattered diffraction and energy dispersive X-ray spectroscopy study of the phase NiSn4

被引：36

作者：

Boettinger, WJ ^{[1
]}

Vaudin, MD

Williams, ME

Bendersky, LA

Wagner, WR

机构：

[1] NIST, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA

[2] KEMET Elect, Greenville, SC 29606 USA

来源：

JOURNAL OF ELECTRONIC MATERIALS | 2003年 / 32卷 / 06期

关键词：

Ni-Sn intermetallic; crystal structure; tin whiskers;

D O I：

10.1007/s11664-003-0135-x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) have been performed on a plate-shaped phase formed through the reaction of Sn and Ni. The phase is formed during extended thermal cycling tests on ceramic capacitors having electroplated tin end terminations. The morphology is identical to that of a phase labeled NiSn3 by J. Haimovich. The phase is shown to have a stoichiometry, NiSn4, and a crystal structure isomorphous to PdSn4, PtSn4, and AuSn4 (Aba2, #41, oC20). The structure can also be described with the higher symmetry structure (Ccca, #68, oC20).

引用

页码：511 / 515

页数：5