A study of Raman spectroscopy and low-temperature specific heat in gel-synthesized amorphous silica

被引:5
作者
Bartolotta, A
Carini, G
D'Angelo, G
Ferrari, M
Fontana, A
Montagna, M
Rossi, F
Tripodo, G
机构
[1] Univ Messina, Dipartimento Fis, I-98166 Messina, Italy
[2] Univ Messina, INFM, I-98166 Messina, Italy
[3] CNR, Ist Tecn Spettroscop, I-98122 Messina, Italy
[4] CNR, Ctr Fis Stati Aggregati, I-38050 Povo, Trento, Italy
[5] Univ Trent, Dipartimento Fis, I-38050 Povo, Trento, Italy
[6] Univ Trent, INFM, I-38050 Povo, Trento, Italy
关键词
D O I
10.1016/S0022-3093(00)00381-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A comparative study of low-temperature specific heat (1.5-25 K), C-p, and low-frequency Raman scattering (< 150 cm(-1)) has been performed in amorphous silica samples synthesized by sol-gel method (xerogels) and thermally densified in a range of densities, from rho = 1250 kg m(-3) to rho = 2100 kg m(-3), close to the density of the melt quenched vitreous silica (v-SiO2). The present analysis concerns the application of the low-energy vibrational dynamics as an appropriate tool for monitoring the progressive thermal densification of silica gels. By comparison with v-SiO2, the Raman and thermal properties of xerogels with increasing thermal treatment temperature revealed the following important results: (i) the existence of a critical treatment temperature at about 870 degreesC, where a homogeneous viscous sintering produces full densification of the samples. This effect is detected by the observations of the Boson peak in Raman spectra at about 45 cm(-1) and of a peak in C-p(T)T (3), very close to those observed in v-SiO2; (ii) in silica xerogels treated at temperatures less than about 800 degreesC, the low-frequency Raman scattering is greater, with a continuous decreasing unstructured shape, and the Boson peak is not detected in the spectra. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
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页码:249 / 254
页数:6
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