Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique -: art. no. 075402

被引:100
作者
Hölscher, H
Gotsmann, B
Allers, W
Schwarz, UD
Fuchs, H
Wiesendanger, R
机构
[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany
[2] Univ Munster, Inst Phys, D-48149 Munster, Germany
关键词
D O I
10.1103/PhysRevB.64.075402
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The measurement principle of dynamic-force microscopy using the frequency-modulation (FM) detection scheme is investigated by analytical as well as numerical approaches. As the detection method is based on the properties of a self-driven oscillator, we discuss the main differences from an externally driven oscillator. We then derive an analytical expression, which clarifies how the measured quantities of the FM technique, the frequency shift, and the gain factor (or "excitation amplitude") are influenced by the time ("phase") shift. Introducing a very general tip-sample force law, we show that the frequency shift is determined by the mean tip-sample force whereas the gain factor is directly related to dissipative processes like hysteresis or viscous damping.
引用
收藏
页数:6
相关论文
共 30 条
[1]   Nonlinear dynamic behavior of an oscillating tip-microlever system and contrast at the atomic scale [J].
Aimé, JP ;
Boisgard, R ;
Nony, L ;
Couturier, G .
PHYSICAL REVIEW LETTERS, 1999, 82 (17) :3388-3391
[2]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[3]   Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J].
Anczykowski, B ;
Kruger, D ;
Fuchs, H .
PHYSICAL REVIEW B, 1996, 53 (23) :15485-15488
[4]   Intermittent contact: tapping or hammering? [J].
Behrend, OP ;
Oulevey, F ;
Gourdon, D ;
Dupas, E ;
Kulik, AJ ;
Gremaud, G ;
Burnham, NA .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S219-S221
[5]  
Bennewitz R, 2000, APPL SURF SCI, V157, pV
[6]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[7]   Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip-microlever system near a surface [J].
Boisgard, R ;
Michel, D ;
Aime, JP .
SURFACE SCIENCE, 1998, 401 (02) :199-205
[8]   Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy [J].
Dürig, U .
APPLIED PHYSICS LETTERS, 1999, 75 (03) :433-435
[9]   Interaction sensing in dynamic force microscopy [J].
Dürig, U .
NEW JOURNAL OF PHYSICS, 2000, 2 :51-512
[10]   ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].
ERLANDSSON, R ;
MCCLELLAND, GM ;
MATE, CM ;
CHIANG, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270