High-radiation-resistant InGaP, InGaAsP, and InGaAs solar cells for multijuction solar cells

被引:75
作者
Dharmarasu, N
Yamaguchi, M
Khan, A
Yamada, T
Tanabe, T
Takagishi, S
Takamoto, T
Ohshima, T
Itoh, H
Imaizumi, M
Matsuda, S
机构
[1] Toyota Technol Inst, Tempaku Ku, Nagoya, Aichi 4688511, Japan
[2] Sumitomo Elect Ind Ltd, Itami Res Labs, Itami, Hyogo 6640016, Japan
[3] Japan Energy Corp, Toda, Saitama 3358502, Japan
[4] Japan Atom Energy Res Inst, Gunma 3701292, Japan
[5] Natl Space Dev Agcy Japan, Tsukuba, Ibaraki 3058505, Japan
关键词
D O I
10.1063/1.1409270
中图分类号
O59 [应用物理学];
学科分类号
摘要
The radiation response of 3 MeV proton-irradiated InGaP, InGaAsP and InGaAs solar cells was measured and analyzed in comparison with those of InP and GaAs. The degradation of the minority-carrier diffusion length was estimated from the spectral response data. The damage coefficient K-L for the 3 MeV proton-irradiated InGaP, InGaAsP and InGaAs was also determined. The radiation resistance increases with an increase in the fraction of In-P bonds in InGaP, InGaAsP and InGaAs. Differences in the radiation resistance of InGaP, InGaAs and InGaAs materials are discussed. Minority-carrier injection under forward bias is found to cause partial recovery of the degradation on irradiated InGaP and InGaAsP cells. (C) 2001 American Institute of Physics.
引用
收藏
页码:2399 / 2401
页数:3
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