Microstructural index to quantify thermal spray deposit microstructures using image analysis

被引:30
作者
Montavon, G
Coddet, C
Berndt, CC
Leigh, SH
机构
[1] Inst Polytech Sevenans, Lab Etud & Rech Mat & Proprietes Surface, F-90010 Belfort, France
[2] SUNY Stony Brook, Ctr Thermal Spray Res, Stony Brook, NY 11755 USA
[3] Res Inst Ind Sci & Technol, Mat Res Div, Pohang 790600, Kyungbuk, South Korea
关键词
Euclidean distance map; fractal dimension; image analysis; metallographic index; quantitative metallography; stereology;
D O I
10.1361/105996398770350972
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The basic metallographic analysis leads to qualitative interpretation of the structural characteristics of a microstructure, for example the presence of phases, and the description of singularities such as inclusions. On the contrary, microstructural characterization which implements image analysis leads to a quantified analysis of structural characteristics. A method is described to assess thermal spray deposit microstructures using image analysis by means of a metallographic index. This index is based on the determination of several stereological and morphological parameters by primary referee to the size-shape distributions of the features, the fractal dimension of the deposit upper surface, and the Euclidean distance map of the bodies of interest. This work employs quantitative metallography on a much wider scale to provide better quality control of deposit microstructures.
引用
收藏
页码:229 / 241
页数:13
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