Effect of angle dependent attempt frequency on Arrhenius-Neel thermal decay in thin film media

被引:8
作者
Igarashi, M [1 ]
Akagi, F
Yoshida, K
Nakatani, Y
机构
[1] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan
[2] Univ Electrocommun, Chofu, Tokyo 1828585, Japan
关键词
angle-dependent attempt frequency; Arrhenius-Neel; time dependent coercivity; thermal fluctuation;
D O I
10.1109/20.908465
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The angle dependence of the attempt frequency f(o) has been determined by assuming isotropic thermal excitation in the anisotropic free energy around the easy axis of a singe-domain particle, The relationship between the logarithmic time and the time-dependent remanence coercivity N-cr was estimated. The acquired equation agrees well with the numerical calculation of the Langevin equation. The conventional formula do not give the correct relationship between H-cr and K-beta (= Kv/kT) because the exponent of K-beta depends on K-beta. The estimated K-beta from Sharrock's formula is 15% larger at K-beta of 100 and 5% smaller at K-beta of 50, Bertram's formula is effective at Ka of 100 but brings 7% smaller estimation at K-beta of 50.
引用
收藏
页码:2459 / 2461
页数:3
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