Adhesion between nanoscale rough surfaces - II. Measurement and comparison with theory

被引:341
作者
Rabinovich, YI
Adler, JJ
Ata, A
Singh, RK
Moudgil, BM [1 ]
机构
[1] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Engn Res Ctr Particle Sci & Technol, Gainesville, FL 32611 USA
基金
美国国家科学基金会;
关键词
adhesion; roughness; surface force; atomic force microscopy; nanoscale;
D O I
10.1006/jcis.2000.7168
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this investigation, the adhesion between particles and plates with root-mean-square, rms, surface roughness of 0.17-10.5 nm was measured by atomic force microscopy. Measurements obtained with particles both larger and smaller than the surface asperities are presented. Results indicate adhesion force decreases sharply with increasing surface roughness in the nanometer scale (<2 nm), followed by a gradual and slow decrease with further increase in roughness. Existing models were found to significantly underestimate adhesion force. Hence, a new model based on a geometry that considers both the height and breadth of asperities yielding an increased asperity radius compared to previous approaches, as detailed in Part I of this series, is applied using both van der Waals and elastic deformation/work of adhesion based approaches. For the system studied in this investigation, the adhesion forces predicted by the proposed model are considerably more accurate than those predicted by past models. (C) 2000 Academic Press.
引用
收藏
页码:17 / 24
页数:8
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