A study of the composition uniformity, electrical and spectroscopic properties of CdZnTe detectors

被引：8

作者：

Gagliardi, MA ^{[1
]}

Nenonen, S ^{[1
]}

Gagliardi, T ^{[1
]}

Hjelt, KT ^{[1
]}

Juvonen, M ^{[1
]}

Tuomi, T ^{[1
]}

Bavdaz, M ^{[1
]}

机构：

[1] Metorex Int Oy, FIN-02631 Espoo, Finland

来源：

SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II | 1997年 / 487卷

关键词：

D O I：

10.1557/PROC-487-77

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The electrical and charge collection properties of a semiconductor detector play an important role in a spectrometer's final performance. However, the studies of these properties often concentrate on only a few samples. In this work over 100 CdZnTe detectors from 12 different growth boules were characterized with one of the following test methods. The composition uniformity was evaluated with low temperature photoluminescence (PL) measurements. From the current-voltage characteristics the differences in CdZnTe detector resistivities were investigated. Charge collection properties, mu tau-products, and energy resolutions were characterized with spectroscopic methods using an alpha and isotopic sources. A wide selection of test results are presented indicating the variety of CdZnTe material.

引用

页码：77 / 82

页数：6