Interpretation of high resolution transmission electron microscope images of short range ordered Ni4Mo

被引：10

作者：

Hata, S ^{[1
]}

Shindo, D

Kuwano, N

Matsumura, S

Oki, K

机构：

[1] Kyushu Univ, Dept Mat Sci & Technol, Kasuga, Fukuoka 8168580, Japan

[2] Tohoku Univ, Inst Adv Mat Proc, Sendai, Miyagi 9808577, Japan

[3] Kyushu Univ, Dept Nucl Engn, Fukuoka 8128581, Japan

来源：

MATERIALS TRANSACTIONS JIM | 1998年 / 39卷 / 09期

关键词：

high resolution transmission electron microscopy (HRTEM); short range order (SRO) in Ni4Mo; multi-slice simulations; image contrast; projection contrast; dynamical diffraction effects of electrons;

D O I：

10.2320/matertrans1989.39.914

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High resolution transmission electron microscope (HRTEM) image contrast of short-range order (SRO) in Ni4Mo alloys has been investigated by means of multi-slice simulations. The HRTEM image contrast of SRO in Ni4Mo coincides with a projection contrast of an SRO structure which involves D1(a), D0(22) and Pt2Mo-type subunit cells in a disordered matrix. Multi-slice simulations revealed that the SRO structure exhibit a projection contrast in the HRTEM Image when the fundamental fee lattice reflections contribute sufficiently to HRTEM imaging. The results indicate that the image of SRO in Ni4Mo can be interpreted in terms of projected potential of atomic columns under an appropriate imaging condition.

引用

页码：914 / 919

页数：6

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