Assessment of density profile automatic evaluation from broadband reflectometry data

被引:12
作者
Varela, P
Manso, M
Vergamota, S
Grossmann, V
Santos, J
机构
[1] Univ Tecn Lisboa, Assoc EURATOM IST Ctr Fusao Nucl, Inst Super Tecn, P-1049001 Lisbon, Portugal
[2] EURATOM, Max Planck Inst Plasmaphys, Garching, Germany
关键词
D O I
10.1063/1.1323248
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Automatic evaluation of electron density profiles from frequency modulated continuous wave (FM-CW) broadband microwave reflectometry on ASDEX Upgrade has been achieved in all plasma regimes combining a high performance system and advanced analysis tools. The results presented demonstrate the capability of the system to resolve the abrupt gradient changes occurring in the edge region during the L-H transition and in the presence of edge localized modes (ELMs). The temporal evolution of the density gradient could be obtained extending from the ohmic and L phases to the ELMy H phase. A new data analysis method that uses sets of consecutive sweeps to extract the group delay is also presented and its use versus single sweep analysis is discussed. It is shown that local perturbations may appear and disappear during the sweep time reinforcing the need to obtain redundant data in very short time intervals and apply rejection/averaging techniques. (C) 2001 American Institute of Physics.
引用
收藏
页码:315 / 318
页数:4
相关论文
共 5 条
[1]  
CLAIRET F, 1994, P 21 EUR C CONTR FUS
[2]  
KIM KW, 1995, REV SCI INSTRUM, V66, P1229, DOI [10.1063/1.1146012, 10.1063/1.1146248]
[3]   Ultrafast broadband frequency modulation of a continuous wave reflectometry system to measure density profiles on ASDEX Upgrade [J].
Silva, A ;
Manso, ME ;
Cupido, L ;
Albrecht, M ;
Serra, F ;
Varela, P ;
Santos, J ;
Vergamota, S ;
Eusebio, F ;
Fernandes, J ;
Grossmann, T ;
Kallenbach, A ;
Kurzan, B ;
Loureiro, C ;
Meneses, L ;
Nunes, I ;
Silva, F ;
Suttrop, W .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (12) :4138-4145
[4]  
SILVA A, 1995, P 22 EUR C CONTR FUS
[5]   Automatic evaluation of plasma density profiles from microwave reflectometry on ASDEX upgrade based on the time-frequency distribution of the reflected signals [J].
Varela, P ;
Manso, M ;
Nunes, I ;
Santos, J ;
Nunes, F ;
Silva, A ;
Silva, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (01) :1060-1063